// usbscan.h

typedef struct _USBSCAN_TIMEOUT {
  ULONG TimeoutRead;
  ULONG TimeoutWrite;
  ULONG TimeoutEvent;
} USBSCAN_TIMEOUT, *PUSBSCAN_TIMEOUT;
View the official Windows Driver Kit DDI reference

NtDoc

No description available.

Edit description on GitHub

Windows Driver Kit DDI reference (ns-usbscan-_usbscan_timeout)

_USBSCAN_TIMEOUT structure

Description

The USBSCAN_TIMEOUT structure stores time-out values for USB bulk IN and bulk OUT operations, and interrupts.

Members

`TimeoutRead`

Specifies the number of seconds to wait for a read operation to time out.

`TimeoutWrite`

Specifies the number of seconds to wait for a write operation to time out.

`TimeoutEvent`

Specifies the number of seconds to wait for an interrupt to occur.

Remarks

A value of zero means to wait forever for the read or write operation or interrupt.

The USBSCAN_TIMEOUT structure is used as a parameter to DeviceIoControl, when the specified I/O control code is IOCTL_SET_TIMEOUT.

USBSCAN_TIMEOUT - NtDoc